Fault modeling and parametric fault detection in analog VLSI circuits using discretization

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چکیده

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ژورنال

عنوان ژورنال: International Journal of Electrical and Computer Engineering (IJECE)

سال: 2019

ISSN: 2088-8708,2088-8708

DOI: 10.11591/ijece.v9i3.pp1598-1605